Measurement techniques

Selection of measurement techniques available for our research:

Optical spectroscopy for material and device development

  • Time-integrated, time resolved (2ps time resolution) and temperature dependent photo- and electroluminescence (4–325K)
  • Microphotoluminescence (500nm spatial resolution)
  • Single photon counting
  • Polarization-resolved spectroscopy using Müller matrix analysis
  • Magnetic field dependent spectroscopy up to 3.5T
  • Raman spectroscopy
  • Optical gain spectroscopy in processed and unprocessed samples (Hakki-Paoli, transmission method, variable stripe length method)

Optical imaging and novel imaging systems

  • Standard spectroscopic optical coherence tomography (OCT and SOCT)
  • Digital and photorefractive holography
  • Digital holographic microscopy
  • Single shot holography
  • Photoacoustics based on high-power semiconductor laser diodes
  • Laser-scanning and confocal microscopy
  • Optical tomography

Dynamics of semiconductor lasers

  • Ultrashort optical pulse measurements using optical autocorrelation
  • Dispersion and chirp measurements using FROG (frequency resolved optical gating)
  • Pulse and dispersion shaping using evolutionary algorithms and Spatial Light Modulators (SLMs)
  • Four-wave mixing in semiconductor lasers

Terahertz technology

  • cw-THz-spectroscopy and imaging based on two stabilized semiconductor lasers
  • Timedomain THz-spectroscopy and imaging using fiber lasers
  • Reflection and transmission tomography and imaging at 300GHz